Prev Up Next
Go backward to Motivation
Go up to Top
Go forward to Standards Panel

Participants

David Abrahams, MOTU

Giuseppe Attardi, Pisa

Matt Austern, SGI

Ulrich Breyman, Bremen

Stephen Cerniglia, RPI

George Collins, Delaware

James Crotinger, Los Alamos

Krzysztof Czarnecki, Daimler-Benz

James Dehnert, SGI

Angel Diaz, IBM

Axel Dold, Ulm

Matthew Dwyer, Kansas St.

Ulrich Eisenecker, Heidelberg

Holger Gast, Tübingen

Robert Glück, Copenhagen

Friedrich von Henke, Ulm

Hoon Hong, N. Carolina St.

Mehdi Jazayeri, TU Wien

Johann Jeuring, Utrecht

Nicolai Josuttis, Bredex

Erich Kaltofen, N. Carolina St.

Ullrich Köthe, Rostock

Uwe Kreppel, Tübingen

Wolfgang Küchlin, Tübingen

Dietmar Kühl, Konstanz

Gary Leavens, Iowa St.

Karl Lieberherr, Northeastern

Rüdiger Loos, Tübingen

David Musser, RPI

Stefan Näher, Halle

Oscar Nierstrasz, Bern

Martin Odersky, South Australia

William Ogden, Ohio St.

Arturo Sanchez-Ruiz, UCV-Caracas, Venezuela

Stefan Schirra, Saarbrücken

Wolfgang Schreiner, RISC-Linz

Sibylle Schupp, RPI

Christoph Schwarzweller, Tübingen

Murali Sitaraman, W. Virginia

Georg Trausmuth, TU Wien

David Vandevoorde, Hewlett-Packard

Todd Veldhuizen, Waterloo

Bruce Weide, Ohio St.

Karsten Weihe, Konstanz

Roland Weiss, Tübingen

Alexandre Zamulin, Novosibirsk

Wolf Zimmermann, Karlsruhe


 

Prev Up Next